Plagiarism Policy

UI: EMFT – Upholding Academic Integrity

1. Commitment to Ethical Publishing

The UI Conference Series: Engineering, Management & Future Technologies (UI: EMFT) strictly adheres to international standards of academic integrity and ethical publication. All submissions are expected to be the original work of the authors and free from unethical practices including, but not limited to:

  • Plagiarism
  • Duplicate or redundant publication
  • Data fabrication or falsification
  • Misattributed authorship

Violations of these principles are taken very seriously and may result in immediate rejection, retraction after publication, and blacklisting of the authors from future conferences.

2. Plagiarism Detection Tools

To ensure originality and authenticity, all manuscripts submitted to UI: EMFT are rigorously screened using advanced plagiarism detection tools:

  • Turnitin
  • CrossCheck (powered by iThenticate and Turnitin technologies)

These tools check submissions against vast databases of published articles, internet sources, and previously submitted papers to identify potential textual similarities.